Alternative Pattering Strategies for Reduced Thermal Stress during Focused Ion Beam Processing

Harald Plank, Roland Schmied, Evelin Fisslthaler, Boril Stefanov Chernev, Claudia Mayrhofer

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMultinational Congress on Microscopy
Publisher.
Pages131-132
Publication statusPublished - 2011
EventMultinational Congress on Microscopy - Graz, Austria
Duration: 30 Aug 20094 Sep 2009

Conference

ConferenceMultinational Congress on Microscopy
CountryAustria
CityGraz
Period30/08/094/09/09

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Plank, H., Schmied, R., Fisslthaler, E., Chernev, B. S., & Mayrhofer, C. (2011). Alternative Pattering Strategies for Reduced Thermal Stress during Focused Ion Beam Processing. In Multinational Congress on Microscopy (pp. 131-132). ..

Alternative Pattering Strategies for Reduced Thermal Stress during Focused Ion Beam Processing. / Plank, Harald; Schmied, Roland; Fisslthaler, Evelin; Chernev, Boril Stefanov; Mayrhofer, Claudia.

Multinational Congress on Microscopy. ., 2011. p. 131-132.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Plank, H, Schmied, R, Fisslthaler, E, Chernev, BS & Mayrhofer, C 2011, Alternative Pattering Strategies for Reduced Thermal Stress during Focused Ion Beam Processing. in Multinational Congress on Microscopy. ., pp. 131-132, Multinational Congress on Microscopy, Graz, Austria, 30/08/09.
Plank H, Schmied R, Fisslthaler E, Chernev BS, Mayrhofer C. Alternative Pattering Strategies for Reduced Thermal Stress during Focused Ion Beam Processing. In Multinational Congress on Microscopy. . 2011. p. 131-132
Plank, Harald ; Schmied, Roland ; Fisslthaler, Evelin ; Chernev, Boril Stefanov ; Mayrhofer, Claudia. / Alternative Pattering Strategies for Reduced Thermal Stress during Focused Ion Beam Processing. Multinational Congress on Microscopy. ., 2011. pp. 131-132
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AU - Mayrhofer, Claudia

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