Alignability equivalence of synchronous sequential circuits

Amnon Rosenmann, Ziyad Hanna

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationSeventh IEEE International High-Level Design Validation and Test Workshop 2002, Cannes, France
Pages111-114
DOIs
Publication statusPublished - 2002

Cite this

Rosenmann, A., & Hanna, Z. (2002). Alignability equivalence of synchronous sequential circuits. In Seventh IEEE International High-Level Design Validation and Test Workshop 2002, Cannes, France (pp. 111-114) https://doi.org/10.1109/HLDVT.2002.1224438

Alignability equivalence of synchronous sequential circuits. / Rosenmann, Amnon; Hanna, Ziyad.

Seventh IEEE International High-Level Design Validation and Test Workshop 2002, Cannes, France. 2002. p. 111-114.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Rosenmann, A & Hanna, Z 2002, Alignability equivalence of synchronous sequential circuits. in Seventh IEEE International High-Level Design Validation and Test Workshop 2002, Cannes, France. pp. 111-114. https://doi.org/10.1109/HLDVT.2002.1224438
Rosenmann A, Hanna Z. Alignability equivalence of synchronous sequential circuits. In Seventh IEEE International High-Level Design Validation and Test Workshop 2002, Cannes, France. 2002. p. 111-114 https://doi.org/10.1109/HLDVT.2002.1224438
Rosenmann, Amnon ; Hanna, Ziyad. / Alignability equivalence of synchronous sequential circuits. Seventh IEEE International High-Level Design Validation and Test Workshop 2002, Cannes, France. 2002. pp. 111-114
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