Advanced X-ray spectrometry using ζ-factors at atomic resolution

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationInternational EELS Workshop
Publisher.
PagesP13-P13
Publication statusPublished - 2013
EventEnhanced Data Generated by Electrons - Sainte Maxime, France
Duration: 26 May 201331 May 2013

Conference

ConferenceEnhanced Data Generated by Electrons
CountryFrance
CitySainte Maxime
Period26/05/1331/05/13

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Grogger, W., Fladischer, S., Fisslthaler, E., & Kothleitner, G. (2013). Advanced X-ray spectrometry using ζ-factors at atomic resolution. In International EELS Workshop (pp. P13-P13). ..