Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods

Julian Wagner, Mario Schmied, Stefan Mitsche

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publication13th European Microscopy Congress
Publisher.
Pages743-744
Publication statusPublished - 2004

Cite this

Wagner, J., Schmied, M., & Mitsche, S. (2004). Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods. In 13th European Microscopy Congress (pp. 743-744). ..

Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods. / Wagner, Julian; Schmied, Mario; Mitsche, Stefan.

13th European Microscopy Congress. ., 2004. p. 743-744.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Wagner, J, Schmied, M & Mitsche, S 2004, Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods. in 13th European Microscopy Congress. ., pp. 743-744.
Wagner J, Schmied M, Mitsche S. Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods. In 13th European Microscopy Congress. . 2004. p. 743-744
Wagner, Julian ; Schmied, Mario ; Mitsche, Stefan. / Advanced investigations of the composition of submicron particles by using EDXS and Monte Carlo methods. 13th European Microscopy Congress. ., 2004. pp. 743-744
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