Advanced full wave ESD generator model for system level coupling simulation

Cai Qing, Jayong Koo, Argha Nandy, David Pommerenke, Jong Sung Lee, Byong Su Seol

Research output: Contribution to journalConference article

Abstract

System level ESD tests can only be performed after hardware is available. Simulating the ESD coupling into a circuit allows at least parametric and quantitative studies of the expected ESD behavior. A complete simulation requires us to model the ESD generator, the passive elements of the DUT and the response of the ICs to injected noise. Having the ultimate objective of combining IC soft error response models with the DUT structure and the ESD generator we report on progresses in modeling the ESD generator and its coupling. The model improves the useful frequency range from a few hundred MHz to about 3 GHz.

Original languageEnglish
Article number4652137
JournalIEEE International Symposium on Electromagnetic Compatibility
Volume2008-January
DOIs
Publication statusPublished - 1 Jan 2008
Externally publishedYes
Event2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, United States
Duration: 18 Aug 200822 Aug 2008

Keywords

  • Electrostatic discharge
  • Numerical modeling

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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