Adapting unit tests by generating combinatorial test data

Hermann Felbinger, Franz Wotawa, Mihai Nica

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Conventional unit tests are still mainly handcrafted. Generalizing conventional unit tests to parameterized unit tests supports automatic test data generation. Methods that were introduced to instantiate parameterized unit tests with concrete values as test data are based on search based approaches, dynamic symbolic execution, or property based testing. In this work, we introduce an approach that retrofits existing conventional unit tests into parameterized unit tests by generalization, and generate test data by combinatorial valuation to adapt existing conventional unit test suites. We conduct an empirical study to investigate whether our test suite adaption approach is beneficial in terms of additional fault detection capabilities and code coverage. Our results show that mutation score and condition coverage increase with feasible effort compared to existing conventional unit tests.

Original languageEnglish
Title of host publicationProceedings - 2018 IEEE 11th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018
PublisherInstitute of Electrical and Electronics Engineers
Pages352-355
Number of pages4
ISBN (Electronic)9781538663523
DOIs
Publication statusPublished - 16 Jul 2018
Event11th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018 - Vasteras, Sweden
Duration: 9 Apr 201813 Apr 2018

Conference

Conference11th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018
CountrySweden
CityVasteras
Period9/04/1813/04/18

Keywords

  • Code coverage
  • Combinatorial testing
  • Mutation score
  • Parameterized unit test

ASJC Scopus subject areas

  • Software
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Felbinger, H., Wotawa, F., & Nica, M. (2018). Adapting unit tests by generating combinatorial test data. In Proceedings - 2018 IEEE 11th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2018 (pp. 352-355). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICSTW.2018.00072