Active feature models

Georg Langs, P. Peloschek, Rene Donner, M. Reiter, Horst Bischof

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProc. of 18th International Conference of Pattern Recognition
Publisher.
Pages417-420
VolumeVolume I
Publication statusPublished - 2006
EventInternational conference of Pattern Recognition (ICPR) - Hong Kong, China
Duration: 20 Aug 200624 Aug 2006

Conference

ConferenceInternational conference of Pattern Recognition (ICPR)
CountryChina
CityHong Kong
Period20/08/0624/08/06

Treatment code (Nähere Zuordnung)

  • Application

Cite this

Langs, G., Peloschek, P., Donner, R., Reiter, M., & Bischof, H. (2006). Active feature models. In Proc. of 18th International Conference of Pattern Recognition (Vol. Volume I, pp. 417-420). ..

Active feature models. / Langs, Georg; Peloschek, P.; Donner, Rene; Reiter, M.; Bischof, Horst.

Proc. of 18th International Conference of Pattern Recognition. Vol. Volume I ., 2006. p. 417-420.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Langs, G, Peloschek, P, Donner, R, Reiter, M & Bischof, H 2006, Active feature models. in Proc. of 18th International Conference of Pattern Recognition. vol. Volume I, ., pp. 417-420, International conference of Pattern Recognition (ICPR), Hong Kong, China, 20/08/06.
Langs G, Peloschek P, Donner R, Reiter M, Bischof H. Active feature models. In Proc. of 18th International Conference of Pattern Recognition. Vol. Volume I. . 2006. p. 417-420
Langs, Georg ; Peloschek, P. ; Donner, Rene ; Reiter, M. ; Bischof, Horst. / Active feature models. Proc. of 18th International Conference of Pattern Recognition. Vol. Volume I ., 2006. pp. 417-420
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