Active feature models

Georg Langs, P. Peloschek, Rene Donner, M. Reiter, Horst Bischof

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProc. of 18th International Conference of Pattern Recognition
Publisher.
Pages417-420
VolumeVolume I
Publication statusPublished - 2006
EventInternational conference of Pattern Recognition (ICPR) - Hong Kong, China
Duration: 20 Aug 200624 Aug 2006

Conference

ConferenceInternational conference of Pattern Recognition (ICPR)
CountryChina
CityHong Kong
Period20/08/0624/08/06

Treatment code (Nähere Zuordnung)

  • Application

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