Active feature models

Georg Langs, P. Peloschek, Rene Donner, M. Reiter, Horst Bischof

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationProc. of 18th International Conference of Pattern Recognition
Publisher.
Pages417-420
VolumeVolume I
Publication statusPublished - 2006
EventInternational Conference on Pattern Recognition: ICPR 2006 - Hong Kong, China
Duration: 20 Aug 200624 Aug 2006

Conference

ConferenceInternational Conference on Pattern Recognition
Country/TerritoryChina
CityHong Kong
Period20/08/0624/08/06

Treatment code (Nähere Zuordnung)

  • Application

Cite this