Absolute frequency measurements and comparisons in iodine at 735nm and 772nm

S. Reinhardt, B. Bernhardt, C. Geppert, R. Holzwarth, G. Huber, S. Karpuk, N. Miski-Oglu, W. Nörtershäuser, C. Novotny, Th. Udem

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Absolute frequency measurements and comparisons in iodine at 735nm and 772nm'. Together they form a unique fingerprint.

Physics

Material Science

Chemistry

Engineering