Ability and Limit of using commercial SMT Inductors as probes for Immunity and Emissions Near field scanning

Giorgi Muchaidze; Jayong Koo; T. Li; Q. Cai; Lijun Han; J. Min; David Johannes Pommerenke

Ability and Limit of using commercial SMT Inductors as probes for Immunity and Emissions Near field scanning

Giorgi Muchaidze, Jayong Koo, T. Li, Q. Cai, Lijun Han, J. Min, David Johannes Pommerenke

Research output: Contribution to conference › Paper › peer-review

Original language	English
Publication status	Published - 2007
Externally published	Yes
Event	ICONIC'2007: 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging - St. Louis, United States Duration: 27 Jun 2007 → 29 Jun 2007

Conference

Conference	ICONIC'2007
Country/Territory	United States
City	St. Louis
Period	27/06/07 → 29/06/07

Cite this

@conference{03795dd57c3b4514b2c1f8e37329aaeb,

title = "Ability and Limit of using commercial SMT Inductors as probes for Immunity and Emissions Near field scanning",

author = "Giorgi Muchaidze and Jayong Koo and T. Li and Q. Cai and Lijun Han and J. Min and Pommerenke, {David Johannes}",

year = "2007",

language = "English",

note = "ICONIC'2007 : 3rd International Conference on Electromagnetic Near-Field Characterization and Imaging ; Conference date: 27-06-2007 Through 29-06-2007",

}