Aberration-Corrected STEM Characterisation of Mn-ion Structural Displacements in La0.7Sr0.3MnO3 Interfacial Dead-Layers

P. Rajak; Daniel Knez; Sandeep Kumar Chaluvadi; Pasquale Orgiani; Giorgio Rossi; Laurence Méchin; Regina Ciancio

Aberration-Corrected STEM Characterisation of Mn-ion Structural Displacements in La0.7Sr0.3MnO3 Interfacial Dead-Layers

P. Rajak, Daniel Knez, Sandeep Kumar Chaluvadi, Pasquale Orgiani, Giorgio Rossi, Laurence Méchin, Regina Ciancio

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to conference › Abstract › peer-review

Original language	English
Pages	419-420
Publication status	Published - Sep 2022
Event	16th Multinational Congress on Microscopy : 16MCM - Best Western Hotel, Brno, Czech Republic Duration: 4 Sep 2022 → 9 Sep 2022

Conference

Conference	16th Multinational Congress on Microscopy
Abbreviated title	16MCM
Country/Territory	Czech Republic
City	Brno
Period	4/09/22 → 9/09/22

ASJC Scopus subject areas

General Materials Science

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Access to Document

https://www.16mcm.cz/programme/#abstract-bookLicence: Other

ESTEEM 3 - Enabling Science and Technology through European Electron Microscopy
Kothleitner, G.
1/01/19 → 31/12/22
Project: Research project

Cite this

@conference{25d4a1cd0378452d9f7cb297def0bde0,

title = "Aberration-Corrected STEM Characterisation of Mn-ion Structural Displacements in La0.7Sr0.3MnO3 Interfacial Dead-Layers",

author = "P. Rajak and Daniel Knez and Chaluvadi, {Sandeep Kumar} and Pasquale Orgiani and Giorgio Rossi and Laurence M{\'e}chin and Regina Ciancio",

year = "2022",

month = sep,

language = "English",

pages = "419--420",

note = "16th Multinational Congress on Microscopy : 16MCM, 16MCM ; Conference date: 04-09-2022 Through 09-09-2022",

}

TY - CONF

T1 - Aberration-Corrected STEM Characterisation of Mn-ion Structural Displacements in La0.7Sr0.3MnO3 Interfacial Dead-Layers

AU - Rajak, P.

AU - Knez, Daniel

AU - Chaluvadi, Sandeep Kumar

AU - Orgiani, Pasquale

AU - Rossi, Giorgio

AU - Méchin, Laurence

AU - Ciancio, Regina

PY - 2022/9

Y1 - 2022/9

M3 - Abstract

SP - 419

EP - 420

T2 - 16th Multinational Congress on Microscopy

Y2 - 4 September 2022 through 9 September 2022

ER -

Aberration-Corrected STEM Characterisation of Mn-ion Structural Displacements in La0.7Sr0.3MnO3 Interfacial Dead-Layers

Conference

ASJC Scopus subject areas

Fields of Expertise

Treatment code (Nähere Zuordnung)

Access to Document

Projects

ESTEEM 3 - Enabling Science and Technology through European Electron Microscopy

Cite this