A systematic method for determining soft-failure robustness of a subsystem

Benjamin Orr, Pratik Maheshwari, Harald Gossner, David Pommerenke, Wolfgang Stadler

Research output: Chapter in Book/Report/Conference proceedingConference paper

Abstract

A systematic method for evaluating soft fail robustness of a DUT subsystem is presented and demonstrated on a camera MIPI interface. Two different mobile phone platforms are studied under TLP injection while various methods for extracting failure thresholds and localization are applied. The root cause for the soft-failure threshold discrepancy is left for future work.

Original languageEnglish
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013
Publication statusPublished - 16 Oct 2013
Externally publishedYes
Event2013 35th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2013 - Las Vegas, NV, United States
Duration: 8 Sep 201313 Sep 2013

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)0739-5159

Conference

Conference2013 35th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2013
CountryUnited States
CityLas Vegas, NV
Period8/09/1313/09/13

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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