@inproceedings{7bee08a0ff754f349034012765cdc35e,
title = "A systematic method for determining soft-failure robustness of a subsystem",
abstract = "A systematic method for evaluating soft fail robustness of a DUT subsystem is presented and demonstrated on a camera MIPI interface. Two different mobile phone platforms are studied under TLP injection while various methods for extracting failure thresholds and localization are applied. The root cause for the soft-failure threshold discrepancy is left for future work.",
author = "Benjamin Orr and Pratik Maheshwari and Harald Gossner and David Pommerenke and Wolfgang Stadler",
year = "2013",
month = oct,
day = "16",
language = "English",
isbn = "9781585372324",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2013",
note = "35th Annual Electrical Overstress/Electrostatic Discharge Symposium : EOS/ESD 2013 ; Conference date: 08-09-2013 Through 13-09-2013",
}