A study on correlation between near-field EMI scan and ESD susceptibility of ICs

Ahmad Hosseinbeig, Omid Hoseini Izadi, Satyajeet Shinde, David Pommerenke, Hideki Shumiya, Junji Maeshima, Kenji Araki

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

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