A study on correlation between near-field EMI scan and ESD susceptibility of ICs

Ahmad Hosseinbeig; Omid Hoseini Izadi; Satyajeet Shinde; David Pommerenke; Hideki Shumiya; Junji Maeshima; Kenji Araki

doi:10.1109/ISEMC.2017.8077861

A study on correlation between near-field EMI scan and ESD susceptibility of ICs

Ahmad Hosseinbeig, Omid Hoseini Izadi, Satyajeet Shinde, David Pommerenke, Hideki Shumiya, Junji Maeshima, Kenji Araki

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Correlation between near-field EMI scan and ESD susceptibility scan of a cellphone CPU IC is investigated. It is shown that the ESD susceptibility of the CPU IC depends on the activity of the IC. Based on the obtained correlation between these two scans, it is sufficient to perform the ESD susceptibility scan only by running the application which highly loads the CPU. This reduces the ESD susceptibility measurement time as well as the probability of physical damage to the IC.

Original language	English
Title of host publication	2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers
Pages	169-174
Number of pages	6
ISBN (Electronic)	9781538622308
DOIs	https://doi.org/10.1109/ISEMC.2017.8077861
Publication status	Published - 20 Oct 2017
Externally published	Yes
Event	2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Washington, United States Duration: 7 Aug 2017 → 11 Aug 2017

Publication series

Name	IEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)	1077-4076
ISSN (Electronic)	2158-1118

Conference

Conference	2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017
Country	United States
City	Washington
Period	7/08/17 → 11/08/17

Keywords

EMI
ESD
soft failure
TLP

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/ISEMC.2017.8077861

Link to publication in Scopus

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Cite this

Hosseinbeig, A., Izadi, O. H., Shinde, S., Pommerenke, D., Shumiya, H., Maeshima, J., & Araki, K. (2017). A study on correlation between near-field EMI scan and ESD susceptibility of ICs. In 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings (pp. 169-174). [8077861] (IEEE International Symposium on Electromagnetic Compatibility). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISEMC.2017.8077861

A study on correlation between near-field EMI scan and ESD susceptibility of ICs. / Hosseinbeig, Ahmad; Izadi, Omid Hoseini; Shinde, Satyajeet; Pommerenke, David; Shumiya, Hideki; Maeshima, Junji; Araki, Kenji.

2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings. Institute of Electrical and Electronics Engineers, 2017. p. 169-174 8077861 (IEEE International Symposium on Electromagnetic Compatibility).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Hosseinbeig, A, Izadi, OH, Shinde, S, Pommerenke, D, Shumiya, H, Maeshima, J & Araki, K 2017, A study on correlation between near-field EMI scan and ESD susceptibility of ICs. in 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings., 8077861, IEEE International Symposium on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, pp. 169-174, 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017, Washington, United States, 7/08/17. https://doi.org/10.1109/ISEMC.2017.8077861

Hosseinbeig A, Izadi OH, Shinde S, Pommerenke D, Shumiya H, Maeshima J et al. A study on correlation between near-field EMI scan and ESD susceptibility of ICs. In 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings. Institute of Electrical and Electronics Engineers. 2017. p. 169-174. 8077861. (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2017.8077861

Hosseinbeig, Ahmad ; Izadi, Omid Hoseini ; Shinde, Satyajeet ; Pommerenke, David ; Shumiya, Hideki ; Maeshima, Junji ; Araki, Kenji. / A study on correlation between near-field EMI scan and ESD susceptibility of ICs. 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings. Institute of Electrical and Electronics Engineers, 2017. pp. 169-174 (IEEE International Symposium on Electromagnetic Compatibility).

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