@inproceedings{4eb0da2870894694a456bc738643500a,
title = "A study on correlation between near-field EMI scan and ESD susceptibility of ICs",
abstract = "Correlation between near-field EMI scan and ESD susceptibility scan of a cellphone CPU IC is investigated. It is shown that the ESD susceptibility of the CPU IC depends on the activity of the IC. Based on the obtained correlation between these two scans, it is sufficient to perform the ESD susceptibility scan only by running the application which highly loads the CPU. This reduces the ESD susceptibility measurement time as well as the probability of physical damage to the IC.",
keywords = "EMI, ESD, soft failure, TLP",
author = "Ahmad Hosseinbeig and Izadi, {Omid Hoseini} and Satyajeet Shinde and David Pommerenke and Hideki Shumiya and Junji Maeshima and Kenji Araki",
year = "2017",
month = oct,
day = "20",
doi = "10.1109/ISEMC.2017.8077861",
language = "English",
series = "IEEE International Symposium on Electromagnetic Compatibility",
publisher = "Institute of Electrical and Electronics Engineers",
pages = "169--174",
booktitle = "2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings",
address = "United States",
note = "2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 ; Conference date: 07-08-2017 Through 11-08-2017",
}