A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC

Klaus Rothbart, Ulrich Neffe, Christian Steger, Reinhold Weiß, Edgar Rieger, Andreas Mühlberger

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationDigest of Papers / 6th IEEE Latin-American Test Workshop
Publisher.
Pages103-108
Publication statusPublished - 2005
EventIEEE Latin-American Test Workshop - Salvador, Brazil
Duration: 30 Mar 20052 Apr 2005

Conference

ConferenceIEEE Latin-American Test Workshop
CountryBrazil
CitySalvador
Period30/03/052/04/05

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