A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC

Klaus Rothbart, Ulrich Neffe, Christian Steger, Reinhold Weiß, Edgar Rieger, Andreas Mühlberger

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationDigest of Papers / 6th IEEE Latin-American Test Workshop
Publisher.
Pages103-108
Publication statusPublished - 2005
EventIEEE Latin-American Test Workshop - Salvador, Brazil
Duration: 30 Mar 20052 Apr 2005

Conference

ConferenceIEEE Latin-American Test Workshop
CountryBrazil
CitySalvador
Period30/03/052/04/05

Cite this

Rothbart, K., Neffe, U., Steger, C., Weiß, R., Rieger, E., & Mühlberger, A. (2005). A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC. In Digest of Papers / 6th IEEE Latin-American Test Workshop (pp. 103-108). ..

A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC. / Rothbart, Klaus; Neffe, Ulrich; Steger, Christian; Weiß, Reinhold; Rieger, Edgar; Mühlberger, Andreas.

Digest of Papers / 6th IEEE Latin-American Test Workshop. ., 2005. p. 103-108.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Rothbart, K, Neffe, U, Steger, C, Weiß, R, Rieger, E & Mühlberger, A 2005, A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC. in Digest of Papers / 6th IEEE Latin-American Test Workshop. ., pp. 103-108, IEEE Latin-American Test Workshop, Salvador, Brazil, 30/03/05.
Rothbart K, Neffe U, Steger C, Weiß R, Rieger E, Mühlberger A. A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC. In Digest of Papers / 6th IEEE Latin-American Test Workshop. . 2005. p. 103-108
Rothbart, Klaus ; Neffe, Ulrich ; Steger, Christian ; Weiß, Reinhold ; Rieger, Edgar ; Mühlberger, Andreas. / A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC. Digest of Papers / 6th IEEE Latin-American Test Workshop. ., 2005. pp. 103-108
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