A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC

Klaus Rothbart, Ulrich Neffe, Christian Steger, Reinhold Weiß, Edgar Rieger, Andreas Mühlberger

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Digest of Papers / 6th IEEE Latin-American Test Workshop
Publisher	.
Pages	103-108
Publication status	Published - 2005
Event	IEEE Latin-American Test Workshop - Salvador, Brazil Duration: 30 Mar 2005 → 2 Apr 2005

Conference	IEEE Latin-American Test Workshop
Country	Brazil
City	Salvador
Period	30/03/05 → 2/04/05

Access to Document

Hardware/Software-Codesign
Pieber, T. W., Steger, C., Weiß, R., Ulz, T., Schachner, M., Kreiner, C. J., Plank, H., Troyer, M., Gressl, L. A., Seifert, C., Warmer, F., Rech, A., Erb, M., Scherr, F., Kammerer, M., Stelzer, P., Frewein, A., Strasser, A., Lindner, J., Ess, A., Feldbacher, M. & Weissteiner, H.
1/01/95 → …
Project: Research area

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AU - Rothbart, Klaus

AU - Neffe, Ulrich

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AU - Weiß, Reinhold

AU - Rieger, Edgar

AU - Mühlberger, Andreas

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