| Original language | English |
|---|---|
| Title of host publication | Digest of Papers / 6th IEEE Latin-American Test Workshop |
| Publisher | . |
| Pages | 103-108 |
| Publication status | Published - 2005 |
| Event | IEEE Latin-American Test Workshop - Salvador, Brazil Duration: 30 Mar 2005 → 2 Apr 2005 |
Conference
| Conference | IEEE Latin-American Test Workshop |
|---|---|
| Country | Brazil |
| City | Salvador |
| Period | 30/03/05 → 2/04/05 |
Cite this
Rothbart, K., Neffe, U., Steger, C., Weiß, R., Rieger, E., & Mühlberger, A. (2005). A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC. In Digest of Papers / 6th IEEE Latin-American Test Workshop (pp. 103-108). ..
A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC. / Rothbart, Klaus; Neffe, Ulrich; Steger, Christian; Weiß, Reinhold; Rieger, Edgar; Mühlberger, Andreas.
Digest of Papers / 6th IEEE Latin-American Test Workshop. ., 2005. p. 103-108.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
Rothbart, K, Neffe, U, Steger, C, Weiß, R, Rieger, E & Mühlberger, A 2005, A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC. in Digest of Papers / 6th IEEE Latin-American Test Workshop. ., pp. 103-108, IEEE Latin-American Test Workshop, Salvador, Brazil, 30/03/05.
Rothbart K, Neffe U, Steger C, Weiß R, Rieger E, Mühlberger A. A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC. In Digest of Papers / 6th IEEE Latin-American Test Workshop. . 2005. p. 103-108
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title = "A Smart Card Test Environment Using Multi-Level Fault Injection in SystemC",
author = "Klaus Rothbart and Ulrich Neffe and Christian Steger and Reinhold Wei{\ss} and Edgar Rieger and Andreas M{\"u}hlberger",
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AU - Weiß, Reinhold
AU - Rieger, Edgar
AU - Mühlberger, Andreas
PY - 2005
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BT - Digest of Papers / 6th IEEE Latin-American Test Workshop
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