A simple frequency response compensation method for current probe measurements of ESD currents

Sen Yang, Jianchi Zhou, David Pommerenke, Dazhao Liu

Research output: Chapter in Book/Report/Conference proceedingConference paper

Abstract

The transfer impedance of a current probe is typically not constant within the current probe's operational frequency range. As it is based on induction, it will suffer from reduced sensitivity at lower frequencies. Thus, a current probe cannot be used directly in a time domain measurement. The low frequency roll-off of a current probe can severely distort the actual waveform. A simple frequency response compensation method is proposed here to enable ESD current measurements with current probes. The method enables a current probe to be used for time domain measurements, such as when measuring ESD transient current and estimating the total transferred charge. If a probe's datasheet provides the transfer impedance for the probe, no additional measurements are needed. Advantages and disadvantages of directly using the measured complex transfer impedance, instead of approximating the transfer impedance by a circuit, is discussed in this paper.

Original languageEnglish
Title of host publication2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers
Pages158-163
Number of pages6
ISBN (Electronic)9781538622308
DOIs
Publication statusPublished - 20 Oct 2017
Externally publishedYes
Event2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Washington, United States
Duration: 7 Aug 201711 Aug 2017

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Conference

Conference2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017
CountryUnited States
CityWashington
Period7/08/1711/08/17

Keywords

  • current probe
  • ESD transient current
  • time domain measurement

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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