A Side Channel Attack Countermeasure using System-On-Chip Power Profile Scrambling

Armin Krieg, Johannes Grinschgl, Christian Steger, Reinhold Weiß, Josef Haid

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publication17th IEEE International On-Line Testing Symposium (IOLTS)
Publisher.
Pages222-227
ISBN (Print)978-1-4577-1053-7
Publication statusPublished - 2011
Event17th IEEE International On-Line Testing Symposium (IOLTS) - Athen, Greece
Duration: 13 Jul 201115 Jul 2011

Conference

Conference17th IEEE International On-Line Testing Symposium (IOLTS)
CountryGreece
CityAthen
Period13/07/1115/07/11

Fields of Expertise

  • Sonstiges

Treatment code (Nähere Zuordnung)

  • Application
  • Experimental

Cite this

Krieg, A., Grinschgl, J., Steger, C., Weiß, R., & Haid, J. (2011). A Side Channel Attack Countermeasure using System-On-Chip Power Profile Scrambling. In 17th IEEE International On-Line Testing Symposium (IOLTS) (pp. 222-227). ..

A Side Channel Attack Countermeasure using System-On-Chip Power Profile Scrambling. / Krieg, Armin; Grinschgl, Johannes; Steger, Christian; Weiß, Reinhold; Haid, Josef.

17th IEEE International On-Line Testing Symposium (IOLTS). ., 2011. p. 222-227.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Krieg, A, Grinschgl, J, Steger, C, Weiß, R & Haid, J 2011, A Side Channel Attack Countermeasure using System-On-Chip Power Profile Scrambling. in 17th IEEE International On-Line Testing Symposium (IOLTS). ., pp. 222-227, 17th IEEE International On-Line Testing Symposium (IOLTS), Athen, Greece, 13/07/11.
Krieg A, Grinschgl J, Steger C, Weiß R, Haid J. A Side Channel Attack Countermeasure using System-On-Chip Power Profile Scrambling. In 17th IEEE International On-Line Testing Symposium (IOLTS). . 2011. p. 222-227
Krieg, Armin ; Grinschgl, Johannes ; Steger, Christian ; Weiß, Reinhold ; Haid, Josef. / A Side Channel Attack Countermeasure using System-On-Chip Power Profile Scrambling. 17th IEEE International On-Line Testing Symposium (IOLTS). ., 2011. pp. 222-227
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