| Original language | English |
|---|---|
| Pages (from-to) | 1-22 |
| Journal | Measurement science & technology |
| Issue number | 20;5 |
| DOIs | |
| Publication status | Published - 2009 |
Treatment code (Nähere Zuordnung)
- Review
- Basic - Fundamental (Grundlagenforschung)
- Application
Cite this
A review of statistical modelling and inference for electrical capacitance tomography. / Watzenig, Daniel; Fox, Colin.
In: Measurement science & technology, No. 20;5, 2009, p. 1-22.Research output: Contribution to journal › Article › Research › peer-review
@article{ba549c23cbd44805839948884f1b29fa,
title = "A review of statistical modelling and inference for electrical capacitance tomography",
author = "Daniel Watzenig and Colin Fox",
year = "2009",
doi = "10.1088/0957-0233/20/5/052002",
language = "English",
pages = "1--22",
journal = "Measurement science & technology",
issn = "0957-0233",
publisher = "IOP Publishing Ltd.",
number = "20;5",
}
TY - JOUR
T1 - A review of statistical modelling and inference for electrical capacitance tomography
AU - Watzenig, Daniel
AU - Fox, Colin
PY - 2009
Y1 - 2009
UR - http://www.iop.org
U2 - 10.1088/0957-0233/20/5/052002
DO - 10.1088/0957-0233/20/5/052002
M3 - Article
SP - 1
EP - 22
JO - Measurement science & technology
JF - Measurement science & technology
SN - 0957-0233
IS - 20;5
ER -