A review of statistical modelling and inference for electrical capacitance tomography

Daniel Watzenig, Colin Fox

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)1-22
JournalMeasurement science & technology
Issue number20;5
DOIs
Publication statusPublished - 2009

Treatment code (Nähere Zuordnung)

  • Review
  • Basic - Fundamental (Grundlagenforschung)
  • Application

Cite this

A review of statistical modelling and inference for electrical capacitance tomography. / Watzenig, Daniel; Fox, Colin.

In: Measurement science & technology, No. 20;5, 2009, p. 1-22.

Research output: Contribution to journalArticleResearchpeer-review

@article{ba549c23cbd44805839948884f1b29fa,
title = "A review of statistical modelling and inference for electrical capacitance tomography",
author = "Daniel Watzenig and Colin Fox",
year = "2009",
doi = "10.1088/0957-0233/20/5/052002",
language = "English",
pages = "1--22",
journal = "Measurement science & technology",
issn = "0957-0233",
publisher = "IOP Publishing Ltd.",
number = "20;5",

}

TY - JOUR

T1 - A review of statistical modelling and inference for electrical capacitance tomography

AU - Watzenig, Daniel

AU - Fox, Colin

PY - 2009

Y1 - 2009

UR - http://www.iop.org

U2 - 10.1088/0957-0233/20/5/052002

DO - 10.1088/0957-0233/20/5/052002

M3 - Article

SP - 1

EP - 22

JO - Measurement science & technology

JF - Measurement science & technology

SN - 0957-0233

IS - 20;5

ER -