Abstract
- A new design for CDM testing is proposed that retains the field charging DDT method while providing a consistent discharge inside of a reed switch. The method is shown to adhere to the current JS-002 standard and to perform at low voltages, but JS-002 failures could not be exactly replicated.
Original language | English |
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Title of host publication | Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020 |
Number of pages | 9 |
ISBN (Electronic) | 978-1-7281-9461-5 |
Publication status | Published - 13 Sept 2020 |
Event | 42nd Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 2020 - Reno, United States Duration: 13 Sept 2020 → 18 Sept 2020 |
Conference
Conference | 42nd Annual Electrical Overstress/Electrostatic Discharge Symposium |
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Abbreviated title | EOS/ESD 2020 |
Country/Territory | United States |
City | Reno |
Period | 13/09/20 → 18/09/20 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering