A radiation-hard curvature compensated bandgap voltage reference

Research output: Contribution to journalArticleResearchpeer-review

Abstract

In this work a radiation-hardened bandgap voltage reference circuit is presented. The circuit is targeted at precision applications, where trimming can be used to achieve a temperature coefficient smaller than 5ppm/K. Curvature compensation is employed and trimming of the temperature coefficient and the curvature is possible. In order to achieve good performance several techniques were combined. Radiation hardening techniques on layout level were used along with design techniques to improve the robustness against total ionizing dose (TID) and process variations. The radiation hardness requirements were set after preliminary irradiation tests. At the layout level optimized transistors were used while at the topology level, a radiation-hardened trimming scheme was employed to mitigate the impact of leakage currents. Chopping techniques were required to ensure good performance over the process and temperature variations. The bandgap was realized in a standard 180 nm CMOS process and circuit performance was verified using extensive simulations.

Translated title of the contributionEine strahlungsfeste Curvature-kompensierte Bandgap-Spannungsreferenz
LanguageEnglish
Pages3-9
Number of pages7
Journale&i - Elektrotechnik und Informationstechnik
Volume135
Issue number1
DOIs
StatusPublished - 1 Feb 2018

Fingerprint

Trimming
Energy gap
Radiation
Networks (circuits)
Electric potential
Radiation hardening
Leakage currents
Temperature
Dosimetry
Transistors
Hardness
Topology
Irradiation

Keywords

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Radiation
    • Aerospace Engineering

    Treatment code (Nähere Zuordnung)

    • Theoretical
    • Experimental
    • Application

    Cite this

    A radiation-hard curvature compensated bandgap voltage reference. / Auer, Mario; Bezhenova, Varvara.

    In: e&i - Elektrotechnik und Informationstechnik, Vol. 135, No. 1, 01.02.2018, p. 3-9.

    Research output: Contribution to journalArticleResearchpeer-review

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