A passive coupling circuit for injecting TLP-like stress pulses into only one end of a driver/receiver system

Benjamin Orr, David Johnsson, Krzysztof Domanski, Harald Gossner, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, a simple passive circuit is presented which allows TLP stress and characterization pulses to be injected into only one side of a driver/receiver system. The circuit is simulated and tested, demonstrating the possibility for directional current injection on the order of 60:1. The circuit also provides a method for measuring both injected currents when paired with a typical TLP system.

Original languageEnglish
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2015
PublisherESD Association
ISBN (Electronic)1585372722, 9781585372737
Publication statusPublished - 30 Oct 2015
Externally publishedYes
Event37th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2015 - Reno, United States
Duration: 27 Sep 20152 Oct 2015

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2015-October
ISSN (Print)0739-5159

Conference

Conference37th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2015
CountryUnited States
CityReno
Period27/09/152/10/15

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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