A novel method for the analysis of BSD generators and coupling using frequency domain

Cai Qing*, Koo Jayong, Giorgi Muchaidze, Andy Martwick, Wang Kai, David Pommerenke

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A concept for analyzing ESD generators and coupling to EUTs in the frequency domain is presented. Its novelty lies in not only taking the current shaping, but also the radiation effects of structural elements and electrical components located within the ESD generator into account, without discharging the ESD generator. This is achieved by using the frequency domain and substituting the electrical breakdown within the ESD generator (contact mode) for one port of a network analyzer. The network analyzer excites all the pulse forming and the radiating elements of the ESD generator as they would be excited during a discharge. This offers the advantage of an increased dynamic range of frequency domain techniques without having to simplify the complex radiation properties of real ESD simulators.

Original languageEnglish
Title of host publication2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006
Pages319-323
Number of pages5
Publication statusPublished - 1 Dec 2006
Externally publishedYes
Event2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006 - Portland, OR, United States
Duration: 14 Aug 200618 Aug 2006

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume2
ISSN (Print)1077-4076

Conference

Conference2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006
CountryUnited States
CityPortland, OR
Period14/08/0618/08/06

Keywords

  • Electrostatic discharge
  • ESD
  • Network analyzer
  • Simulation

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Qing, C., Jayong, K., Muchaidze, G., Martwick, A., Kai, W., & Pommerenke, D. (2006). A novel method for the analysis of BSD generators and coupling using frequency domain. In 2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006 (pp. 319-323). [1706319] (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2).