@inproceedings{977faaf4f387411c85203e4c67196a23,
title = "A novel method for ESD soft error analysis on integrated circuits using a TEM cell",
abstract = "The ultimate goal of this work is to predict ESD system level behavior. A methodology which can evaluate the IC immunity in terms of ESD-induced soft error is introduced. A modified TEM cell and a simple test board with a memory IC are designed for this purpose. The correlation between product level ESD standard test and the proposed IC immunity test is discussed.",
author = "Jongsung Lee and Jaedeok Lim and Byongsu Seol and Zhen Li and David Pommerenke",
year = "2012",
month = nov,
day = "27",
language = "English",
isbn = "1585372188",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, EOS/ESD 2012",
note = "34th Annual Electrical Overstress/Electrostatic Discharge Symposium : EOS/ESD 2012 ; Conference date: 09-09-2012 Through 14-09-2012",
}