A nonlinear microcontroller power distribution network model for the characterization of immunity to electrical fast transients

Jayong Koo*, Lijun Han, Scott Herrin, Richard Moseley, Ross Carlton, Daryl G. Beetner, David Pommerenke

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

A nonlinear power distribution network model for characterizing the immunity of integrated circuits (ICs) to electrical fast transients (EFTs) is proposed and validated. The model includes electrostatic discharge (ESD) protection diodes and passive impedances between power domains. Model parameters are based on external measurements using a vector network analyzer and curve tracer. Impedance is measured between pins while the IC is biased and operating, and is used to determine individual elements of the network model. Inclusion of active power-clamp circuitry is also explored. The model is able to successfully predict pin currents and voltages during EFTs on the power pin when the IC is operating or turned off and when the ESD power clamp is either activated or not activated. This model might be used to evaluate the immunity of the IC in a variety of systems and to better understand why failures occur within the IC and how to fix them.

Original languageEnglish
Pages (from-to)611-619
Number of pages9
JournalIEEE Transactions on Electromagnetic Compatibility
Volume51
Issue number3 PART 2
DOIs
Publication statusPublished - 16 Jul 2009
Externally publishedYes

Keywords

  • Electrostatic discharge (ESD)
  • Modeling
  • Power distribution

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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