A new test setup and method for the calibration of current clamps

David Pommerenke*, Ramachandran Chundru, Sunitha Chandra

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

Current probes are widely used to measure the common mode currents in electromagnetic compatibility (EMC) applications. Often, it is necessary to characterize the ratio of measured voltage to the common mode currents up to gigahertz (GHz) frequencies. Existing calibration methods for current probes suffer from the problem of not directly measuring the current within the current clamp. Instead they either reconstruct the current from measurements at other locations or they use assumptions regarding the geometry which allows them to use a current that is measured at a different location without applying a mathematical correction. For example, by maintaining a 50-Ω transmission-line impedance the current can be determined with low uncertainty. The proposed method overcomes these disadvantages by directly measuring the current at the center of the current clamp. This way the mechanical dimensions of the test setup are not critical anymore, i.e., one setup can be easily used to measure a large variety of clamps. The method is primarily applicable for current monitoring probes in the frequency domain.

Original languageEnglish
Pages (from-to)335-343
Number of pages9
JournalIEEE Transactions on Electromagnetic Compatibility
Volume47
Issue number2
DOIs
Publication statusPublished - 1 May 2005
Externally publishedYes

Keywords

  • Calibration
  • Current clamp
  • Current probe
  • Transfer function
  • Transfer impedance

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'A new test setup and method for the calibration of current clamps'. Together they form a unique fingerprint.

  • Cite this