A New Method for Measuring Parasitics of Super Junction Power MOSFETs

Michael Fuchs, Lukas Spielberger, Carsten Sygulla, Bernd Deutschmann

Research output: Contribution to conferencePaperResearchpeer-review

Original languageGerman
Publication statusPublished - 3 Sep 2019
EventEPE'19 ECCE Europe: 21st European Conference on Power Electronics and Applications - Genova, Genova, Italy
Duration: 3 Sep 20195 Sep 2019
http://www.epe2019.com/

Conference

ConferenceEPE'19 ECCE Europe
CountryItaly
CityGenova
Period3/09/195/09/19
Internet address

Cite this

Fuchs, M., Spielberger, L., Sygulla, C., & Deutschmann, B. (2019). A New Method for Measuring Parasitics of Super Junction Power MOSFETs. Paper presented at EPE'19 ECCE Europe, Genova, Italy.

A New Method for Measuring Parasitics of Super Junction Power MOSFETs. / Fuchs, Michael; Spielberger, Lukas; Sygulla, Carsten; Deutschmann, Bernd.

2019. Paper presented at EPE'19 ECCE Europe, Genova, Italy.

Research output: Contribution to conferencePaperResearchpeer-review

Fuchs, M, Spielberger, L, Sygulla, C & Deutschmann, B 2019, 'A New Method for Measuring Parasitics of Super Junction Power MOSFETs' Paper presented at EPE'19 ECCE Europe, Genova, Italy, 3/09/19 - 5/09/19, .
Fuchs M, Spielberger L, Sygulla C, Deutschmann B. A New Method for Measuring Parasitics of Super Junction Power MOSFETs. 2019. Paper presented at EPE'19 ECCE Europe, Genova, Italy.
Fuchs, Michael ; Spielberger, Lukas ; Sygulla, Carsten ; Deutschmann, Bernd. / A New Method for Measuring Parasitics of Super Junction Power MOSFETs. Paper presented at EPE'19 ECCE Europe, Genova, Italy.
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