A New Current Probe for Measuring Transient Events Under Data Traffic

Omid Hoseini Izadi; David Johannes Pommerenke; DongHyun Kim

A New Current Probe for Measuring Transient Events Under Data Traffic

Omid Hoseini Izadi, David Johannes Pommerenke, DongHyun Kim

Institute of Electronics (4390)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

Using inductive current measurement technique, a new current probe is proposed that allows transient current measurement on data traces without disturbing the normal operation or transfer rate of the trace under test. The proposed probe layout, circuit model, and frequency response is discussed in detail.

Original language	English
Title of host publication	Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020
Number of pages	8
ISBN (Electronic)	978-1-7281-9461-5
Publication status	Published - 13 Sep 2020
Event	42nd Annual EOS/ESD Symposium - Hybrider Event, United States Duration: 13 Sep 2020 → 17 Sep 2020

Conference

Conference	42nd Annual EOS/ESD Symposium
Abbreviated title	EOS/ESD 2020
Country/Territory	United States
City	Hybrider Event
Period	13/09/20 → 17/09/20

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

https://ieeexplore.ieee.org/document/9241219

Cite this

@inproceedings{3ecdef6d03a643e7b3a48407569fac0d,

title = "A New Current Probe for Measuring Transient Events Under Data Traffic",

abstract = "Using inductive current measurement technique, a new current probe is proposed that allows transient current measurement on data traces without disturbing the normal operation or transfer rate of the trace under test. The proposed probe layout, circuit model, and frequency response is discussed in detail.",

author = "Izadi, {Omid Hoseini} and Pommerenke, {David Johannes} and DongHyun Kim",

year = "2020",

month = sep,

day = "13",

language = "English",

booktitle = "Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020",

note = "42nd Annual EOS/ESD Symposium , EOS/ESD 2020 ; Conference date: 13-09-2020 Through 17-09-2020",

}

TY - GEN

T1 - A New Current Probe for Measuring Transient Events Under Data Traffic

AU - Izadi, Omid Hoseini

AU - Pommerenke, David Johannes

AU - Kim, DongHyun

PY - 2020/9/13

Y1 - 2020/9/13

N2 - Using inductive current measurement technique, a new current probe is proposed that allows transient current measurement on data traces without disturbing the normal operation or transfer rate of the trace under test. The proposed probe layout, circuit model, and frequency response is discussed in detail.

AB - Using inductive current measurement technique, a new current probe is proposed that allows transient current measurement on data traces without disturbing the normal operation or transfer rate of the trace under test. The proposed probe layout, circuit model, and frequency response is discussed in detail.

M3 - Conference paper

BT - Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020

T2 - 42nd Annual EOS/ESD Symposium

Y2 - 13 September 2020 through 17 September 2020

ER -

A New Current Probe for Measuring Transient Events Under Data Traffic

Abstract

Conference

ASJC Scopus subject areas

Access to Document

Fingerprint

Cite this