Abstract
We propose a fast method for identifying the jitter tolerance curves of high-speed phase locked loops. The method is based on an adaptive recursion and uses known tail fitting meth-
ods to realize a fast optimization combined with a small number of jitter samples. It allows for efficient behavioral simulations, and can also be applied to hardware measurements. A typical
modeling example demonstrates applicability to both software and hardware scenarios and achieves simulated measurement times in the range of few hundred milliseconds.
ods to realize a fast optimization combined with a small number of jitter samples. It allows for efficient behavioral simulations, and can also be applied to hardware measurements. A typical
modeling example demonstrates applicability to both software and hardware scenarios and achieves simulated measurement times in the range of few hundred milliseconds.
| Original language | English |
|---|---|
| Title of host publication | Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011 |
| Publisher | Institute of Electrical and Electronics Engineers |
| Pages | 1-6 |
| ISBN (Print) | 978-1-61284-208-0 |
| DOIs | |
| Publication status | Published - 2011 |
| Event | Design, Automation and Test in Europe Conference and Exhibition - Grenoble, France Duration: 10 Mar 2015 → 10 Mar 2015 |
Conference
| Conference | Design, Automation and Test in Europe Conference and Exhibition |
|---|---|
| Country/Territory | France |
| City | Grenoble |
| Period | 10/03/15 → 10/03/15 |
Fields of Expertise
- Information, Communication & Computing