A measurement technique for ESD current spreading on a PCB using near field scanning

Wei Huang*, David Pommerenke, Jiang Xiao, Dazhao Liu, Jin Min, Giorgi Muchaidze, Soonjae Kwon, Ki Hyuk Kim

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

Electrostatic discharge (ESD) can cause interference or damage in circuits in many ways e.g., by E- or H-field coupling or via conduction paths. Although we can roughly estimate the voltage and current at the injection point during an ESD event, the real offending parameter is mostly the ESD current spreading throughout the system. Those currents can be simulated if great simplifications of the system are accepted. However, even in moderately complex systems the ability to simulate is limited by lack of models and computational resources. Independent of the complexity, but obviously not free of its own limitations is a measurement technique that captures the current as a function of time and location through the system. This article describes the proof on concept of ESD such a measurement technique that allows reconstructing the spreading current as a movie from magnetic field measurements. It details the technique, question of probe selection and how to process the data to present the current spread as a movie.

Original languageEnglish
Title of host publication2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009
Pages18-23
Number of pages6
DOIs
Publication statusPublished - 1 Dec 2009
Externally publishedYes
Event2009 IEEE International Symposium on Electromagnetic Compatibility: EMC 2009 - Austin, United States
Duration: 17 Aug 200921 Aug 2009

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076

Conference

Conference2009 IEEE International Symposium on Electromagnetic Compatibility
Country/TerritoryUnited States
CityAustin
Period17/08/0921/08/09

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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