A low frequency electric field probe for near-field measurement in EMC applications

Guanghua Li, David Pommerenke, Jin Min

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A low frequency electric field probe with high sensitivity was designed for locating radiated emissions source in electronic systems from 10 kHz to 100 MHz. This probe consists of a dipole at probe tip loaded with an op-amp built instrumentation amplifier, whose output then is amplified by a cascaded RF amplifier. The probe dipole is capacitively loaded by the instrumentation amplifier, resulting in a flat frequency response with high sensitivity at low frequency. The instrumentation amplifier also converts differential dipole output to single-ended signal without the need of an external hybrid. Additionally, the instrument amplifier suppresses common-mode noise picked up by the probe dipole. Measured data from probe above a microstrip trace shows flat frequency response of wanted field coupling and 30 dB - 40 dB suppression of unwanted field coupling from 10 kHz to 100 MHz.

Original languageEnglish
Title of host publication2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers
Pages498-503
Number of pages6
ISBN (Electronic)9781538622308
DOIs
Publication statusPublished - 20 Oct 2017
Externally publishedYes
Event2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Washington, United States
Duration: 7 Aug 201711 Aug 2017

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Conference

Conference2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017
CountryUnited States
CityWashington
Period7/08/1711/08/17

Keywords

  • electric field probe
  • high sensitivty
  • instrumentation amplifier
  • low frequency measurement
  • near-field measurement

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Li, G., Pommerenke, D., & Min, J. (2017). A low frequency electric field probe for near-field measurement in EMC applications. In 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings (pp. 498-503). [8077921] (IEEE International Symposium on Electromagnetic Compatibility). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISEMC.2017.8077921