A dual-current-probe method for characterizing common-mode loop impedance

Geping Liu*, Yimin Ding, Chingchi Chen, Richard Kautz, James L. Drewniak, David J. Pommerenke, Marina Y. Koledintseva

*Corresponding author for this work

Research output: Contribution to conferencePaper

Abstract

The definition of common-mode loop impedance is proposed instead of the ambiguous definition of common-mode impedance. Moreover, a non-invasive measurement method to characterize the common-mode loop impedance using dual clamp-on current probe is presented herein. The frequency responses of the current probes are de-embedded through a calibration procedure. Independent direct measurements using a network analyzer corroborate the validity of the Dual-Current-Probe Method.

Original languageEnglish
Pages1239-1244
Number of pages6
Publication statusPublished - 14 Jul 2003
Externally publishedYes
EventProceedings of the 20th IEEE Information and Measurement Technology Conference - Vail, CO, United States
Duration: 20 May 200322 May 2003

Conference

ConferenceProceedings of the 20th IEEE Information and Measurement Technology Conference
CountryUnited States
CityVail, CO
Period20/05/0322/05/03

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'A dual-current-probe method for characterizing common-mode loop impedance'. Together they form a unique fingerprint.

  • Cite this

    Liu, G., Ding, Y., Chen, C., Kautz, R., Drewniak, J. L., Pommerenke, D. J., & Koledintseva, M. Y. (2003). A dual-current-probe method for characterizing common-mode loop impedance. 1239-1244. Paper presented at Proceedings of the 20th IEEE Information and Measurement Technology Conference, Vail, CO, United States.