A disordered layered phase in thin films of sexithiophene

Armin Moser*, Ingo Salzmann, Martin Oehzelt, Alfred Neuhold, Heinz-Georg Flesch, Jan Ivanco, Sergiu Pop, Teodor Toader, Dietrich R.T. Zahn, Detlef-Matthias Smilgies, Roland Resel*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

This Letter reports the impact of the evaporation rate on the crystallographic phase formation of vacuum deposited α-sexithiophene thin films studied by X-ray diffraction methods. The experiments reveal the formation of two crystal phases, one of which is a thermodynamically stable phase occurring at low rates, while the second is favored by high rates. This second phase exhibits an increased layer spacing and diffraction features typical for two-dimensional crystals which are laterally ordered but without interlayer correlations of the molecular positions. This disordered layered phase comprises molecules of nonuniform conformations, and is kinetically induced.
Original languageEnglish
Pages (from-to)51-55
JournalChemical Physics Letters
Volume574
DOIs
Publication statusPublished - 2013

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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