A consistent path for phase determination based on transmission electron microscopy techniques and supporting simulations

Lukas Konrad, Haishuang Zhao, Christian Gspan, John Rehr, Ute Kolb, Martina Lattemann, Gerald Kothleitner

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)41-49
JournalMicron
Volume115
DOIs
Publication statusPublished - 2018

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

A consistent path for phase determination based on transmission electron microscopy techniques and supporting simulations. / Konrad, Lukas; Zhao, Haishuang; Gspan, Christian; Rehr, John; Kolb, Ute; Lattemann, Martina; Kothleitner, Gerald.

In: Micron, Vol. 115, 2018, p. 41-49.

Research output: Contribution to journalArticleResearchpeer-review

Konrad, Lukas ; Zhao, Haishuang ; Gspan, Christian ; Rehr, John ; Kolb, Ute ; Lattemann, Martina ; Kothleitner, Gerald. / A consistent path for phase determination based on transmission electron microscopy techniques and supporting simulations. In: Micron. 2018 ; Vol. 115. pp. 41-49.
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AU - Konrad, Lukas

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AU - Lattemann, Martina

AU - Kothleitner, Gerald

PY - 2018

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