A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride-and oxide thin films

Michael Rogers, Gerald Kothleitner, Bernhard Schaffer, W. Waldhauser

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationEDGE 2005 - Book of Abstracts
Publisher.
Pages48-48
Publication statusPublished - 2005
EventEnhanced Data Generated by Electrons - Grundlsee, Austria
Duration: 1 May 20055 May 2005

Conference

ConferenceEnhanced Data Generated by Electrons
CountryAustria
CityGrundlsee
Period1/05/055/05/05

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