A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride-and oxide thin films

Michael Rogers, Gerald Kothleitner, Bernhard Schaffer, W. Waldhauser

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationEDGE 2005 - Book of Abstracts
Publisher.
Pages48-48
Publication statusPublished - 2005
EventEnhanced Data Generated by Electrons - Grundlsee, Austria
Duration: 1 May 20055 May 2005

Conference

ConferenceEnhanced Data Generated by Electrons
CountryAustria
CityGrundlsee
Period1/05/055/05/05

Cite this

Rogers, M., Kothleitner, G., Schaffer, B., & Waldhauser, W. (2005). A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride-and oxide thin films. In EDGE 2005 - Book of Abstracts (pp. 48-48). ..

A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride-and oxide thin films. / Rogers, Michael; Kothleitner, Gerald; Schaffer, Bernhard; Waldhauser, W.

EDGE 2005 - Book of Abstracts. ., 2005. p. 48-48.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Rogers, M, Kothleitner, G, Schaffer, B & Waldhauser, W 2005, A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride-and oxide thin films. in EDGE 2005 - Book of Abstracts. ., pp. 48-48, Enhanced Data Generated by Electrons, Grundlsee, Austria, 1/05/05.
Rogers M, Kothleitner G, Schaffer B, Waldhauser W. A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride-and oxide thin films. In EDGE 2005 - Book of Abstracts. . 2005. p. 48-48
Rogers, Michael ; Kothleitner, Gerald ; Schaffer, Bernhard ; Waldhauser, W. / A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride-and oxide thin films. EDGE 2005 - Book of Abstracts. ., 2005. pp. 48-48
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