A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride- and oxide thin films

Michael Rogers, Gerald Kothleitner, Bernhard Schaffer, W. Waldhauser

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2005
EventEDGE 2005 - Grundlsee
Duration: 1 May 20055 May 2005

Conference

ConferenceEDGE 2005
CityGrundlsee
Period1/05/055/05/05

Cite this

Rogers, M., Kothleitner, G., Schaffer, B., & Waldhauser, W. (2005). A comprehensive EELS/EFTEM study of focused ion beam prepared samples of nitride- and oxide thin films. Poster session presented at EDGE 2005, Grundlsee, .