A Comparison of Conducted Transient Disturbances and Failure Signatures for CMOS Integrated Circuits

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	International Workshop on Electromagnetic Compatibility of Integrated Circuits
Publisher	.
Pages	151-156
Publication status	Published - 2005

Fields of Expertise

@inproceedings{26d1a6b12c72447baabecd6e1992a097,

title = "A Comparison of Conducted Transient Disturbances and Failure Signatures for CMOS Integrated Circuits",

author = "Bernd Deutschmann",

year = "2005",

language = "English",

pages = "151--156",

booktitle = "International Workshop on Electromagnetic Compatibility of Integrated Circuits",

publisher = ".",

}