A comparison between quantitative EELS and APFIM microanalysis of carbonitride grains in cermets

J. Zackrisson, W. Grogger, F. Hofer, H. O. Andrén

Research output: Contribution to journalArticleResearchpeer-review

Abstract

Microstructural characterisation of cermet materials is often performed using scanning electron microscopy (SEM) and transmission electron microscopy (TEM) in combination with energy dispersive X-ray analysis (EDX). Due to the poor detection efficiency of light elements with EDX, carbon and nitrogen cannot be properly quantified. Instead, atom-probe field-ion microscopy (APFIM) has been used to accurately determine the content of light elements. However, this is a time-consuming method, especially when taking into account the fact that several APFIM specimens have to be prepared in a controlled way to analyse all phases present in one TEM specimen. Therefore, it is of interest to evaluate whether transmission electron energy-loss spectroscopy (EELS) can be considered an alternative to APFIM for light element analysis. In this paper, we make a comparison of results from APFIM and quantitative EELS microanalysis of carbon and nitrogen in Ti(C, N) -based cermets. Our results show that the agreement between the two methods is good enough to permit most future analyses of light elements in these materials to be performed in the TEM using EELS. Copyright (C) 1999 Elsevier Science B.V.

Original languageEnglish
Pages (from-to)273-281
Number of pages9
JournalUltramicroscopy
Volume79
Issue number1-4
DOIs
Publication statusPublished - 1 Sep 1999

Fingerprint

cermets
Carbon nitride
Electron energy loss spectroscopy
Cermets
light elements
Microanalysis
microanalysis
Microscopic examination
energy dissipation
electron energy
Ions
microscopy
Atoms
Energy dispersive X ray analysis
probes
Transmission electron microscopy
spectroscopy
transmission electron microscopy
atoms
Cermet Cements

Keywords

  • Cermets
  • Hardmetals
  • Light elements
  • TEM
  • Ti(C, N)

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this

A comparison between quantitative EELS and APFIM microanalysis of carbonitride grains in cermets. / Zackrisson, J.; Grogger, W.; Hofer, F.; Andrén, H. O.

In: Ultramicroscopy, Vol. 79, No. 1-4, 01.09.1999, p. 273-281.

Research output: Contribution to journalArticleResearchpeer-review

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