A Combined X-ray Reflectivity, Ellipsometry and Atomic Force Micrsocopy Study on Thin Parylene-C Films

Heinz-Georg Flesch, Oliver Werzer, Martin Weis, Jan Jakabovic, Jaroslav Kovac, Daniel Hasko, Georg Jakopic, Harry J Wondergem, Roland Resel

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2008
EventXTOP 2008 - Linz, Austria
Duration: 15 Sep 200819 Sep 2008


ConferenceXTOP 2008
CityLinz, Austria

Treatment code (Nähere Zuordnung)

  • Experimental

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