A Combined X-ray Reflectivity, Ellipsometry and Atomic Force Micrsocopy Study on Thin Parylene-C Films

Heinz-Georg Flesch, Oliver Werzer, Martin Weis, Jan Jakabovic, Jaroslav Kovac, Daniel Hasko, Georg Jakopic, Harry J Wondergem, Roland Resel

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2008
EventXTOP 2008 - Linz, Austria
Duration: 15 Sep 200819 Sep 2008

Conference

ConferenceXTOP 2008
CityLinz, Austria
Period15/09/0819/09/08

Treatment code (Nähere Zuordnung)

  • Experimental

Cite this

Flesch, H-G., Werzer, O., Weis, M., Jakabovic, J., Kovac, J., Hasko, D., ... Resel, R. (2008). A Combined X-ray Reflectivity, Ellipsometry and Atomic Force Micrsocopy Study on Thin Parylene-C Films. Poster session presented at XTOP 2008, Linz, Austria, .