A combined SNMS and EFTEM/EELS study on focused ion beam prepared vanadium nitride thin films

Gerald Kothleitner, Michael Rogers, A. Berendes, W. Bock, Bernd Kolbesen

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)66-76
JournalApplied Surface Science
Volume252
Issue number1
Publication statusPublished - 2005

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