A combined SNMS and EFTEM/EELS study on focused ion beam prepared vanadium nitride thin films

Gerald Kothleitner, Michael Rogers, A. Berendes, W. Bock, Bernd Kolbesen

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)66-76
JournalApplied Surface Science
Volume252
Issue number1
Publication statusPublished - 2005

Cite this

A combined SNMS and EFTEM/EELS study on focused ion beam prepared vanadium nitride thin films. / Kothleitner, Gerald; Rogers, Michael; Berendes, A.; Bock, W.; Kolbesen, Bernd.

In: Applied Surface Science, Vol. 252, No. 1, 2005, p. 66-76.

Research output: Contribution to journalArticleResearchpeer-review

Kothleitner, Gerald ; Rogers, Michael ; Berendes, A. ; Bock, W. ; Kolbesen, Bernd. / A combined SNMS and EFTEM/EELS study on focused ion beam prepared vanadium nitride thin films. In: Applied Surface Science. 2005 ; Vol. 252, No. 1. pp. 66-76.
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AU - Kolbesen, Bernd

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