3D Nanoprinting Via Laser-Assisted Electron Beam Induced Deposition: Growth Kinetics, Enhanced Purity and Electrical Resistivity

Brett B. Lewis, Robert Winkler, Xiahan Sang, Puspha Pudasaini, Michael Stanford, Harald Plank, Raymond Unocic, Jason D. Fowlkes, P. Rack

Research output: Contribution to journal › Article › Research › peer-review

Original languageEnglish
Pages (from-to)801-812
JournalBeilstein Journal of Nanotechnology
Volume8
DOIs
Publication statusPublished - 2017

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

3D Nanoprinting Via Laser-Assisted Electron Beam Induced Deposition: Growth Kinetics, Enhanced Purity and Electrical Resistivity. / Lewis, Brett B.; Winkler, Robert; Sang, Xiahan; Pudasaini, Puspha; Stanford, Michael; Plank, Harald; Unocic, Raymond; Fowlkes, Jason D.; Rack, P.

In: Beilstein Journal of Nanotechnology , Vol. 8, 2017, p. 801-812.

Research output: Contribution to journal › Article › Research › peer-review

Lewis, BB, Winkler, R, Sang, X, Pudasaini, P, Stanford, M, Plank, H, Unocic, R, Fowlkes, JD & Rack, P 2017, '3D Nanoprinting Via Laser-Assisted Electron Beam Induced Deposition: Growth Kinetics, Enhanced Purity and Electrical Resistivity' Beilstein Journal of Nanotechnology , vol. 8, pp. 801-812. https://doi.org/10.3762/bjnano.8.83
Lewis BB, Winkler R, Sang X, Pudasaini P, Stanford M, Plank H et al. 3D Nanoprinting Via Laser-Assisted Electron Beam Induced Deposition: Growth Kinetics, Enhanced Purity and Electrical Resistivity. Beilstein Journal of Nanotechnology . 2017;8:801-812. https://doi.org/10.3762/bjnano.8.83
Lewis, Brett B. ; Winkler, Robert ; Sang, Xiahan ; Pudasaini, Puspha ; Stanford, Michael ; Plank, Harald ; Unocic, Raymond ; Fowlkes, Jason D. ; Rack, P. / 3D Nanoprinting Via Laser-Assisted Electron Beam Induced Deposition: Growth Kinetics, Enhanced Purity and Electrical Resistivity. In: Beilstein Journal of Nanotechnology . 2017 ; Vol. 8. pp. 801-812.
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