3D Elemental Mapping using X-Ray Spectrometry in a Dual Beam-Focused Ion Beam

Julian Wagner, Miroslava Schaffer, Mario Schmied, M. Novak

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationMicroscopy and Microanalysis
Publisher.
Pages1242-1243
Volume12, Suppl.
DOIs
Publication statusPublished - 2006
EventMicroscopy and Microanalysis - Chicago, United States
Duration: 30 Jul 20063 Aug 2006

Publication series

NameMicroscopy and microanalysis

Conference

ConferenceMicroscopy and Microanalysis
CountryUnited States
CityChicago
Period30/07/063/08/06

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Cite this

Wagner, J., Schaffer, M., Schmied, M., & Novak, M. (2006). 3D Elemental Mapping using X-Ray Spectrometry in a Dual Beam-Focused Ion Beam. In Microscopy and Microanalysis (Vol. 12, Suppl., pp. 1242-1243). (Microscopy and microanalysis). .. https://doi.org/10.1017/S1431927606066980