3D Elemental Mapping using X-Ray Spectrometry in a Dual Beam-Focused Ion Beam

Julian Wagner, Miroslava Schaffer, Mario Schmied, M. Novak

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMicroscopy and Microanalysis
Publisher.
Pages1242-1243
Volume12, Suppl.
DOIs
Publication statusPublished - 2006
EventMicroscopy and Microanalysis - Chicago, United States
Duration: 30 Jul 20063 Aug 2006

Publication series

NameMicroscopy and microanalysis

Conference

ConferenceMicroscopy and Microanalysis
CountryUnited States
CityChicago
Period30/07/063/08/06

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Cite this

Wagner, J., Schaffer, M., Schmied, M., & Novak, M. (2006). 3D Elemental Mapping using X-Ray Spectrometry in a Dual Beam-Focused Ion Beam. In Microscopy and Microanalysis (Vol. 12, Suppl., pp. 1242-1243). (Microscopy and microanalysis). .. https://doi.org/10.1017/S1431927606066980

3D Elemental Mapping using X-Ray Spectrometry in a Dual Beam-Focused Ion Beam. / Wagner, Julian; Schaffer, Miroslava; Schmied, Mario; Novak, M.

Microscopy and Microanalysis. Vol. 12, Suppl. ., 2006. p. 1242-1243 (Microscopy and microanalysis).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Wagner, J, Schaffer, M, Schmied, M & Novak, M 2006, 3D Elemental Mapping using X-Ray Spectrometry in a Dual Beam-Focused Ion Beam. in Microscopy and Microanalysis. vol. 12, Suppl., Microscopy and microanalysis, ., pp. 1242-1243, Microscopy and Microanalysis, Chicago, United States, 30/07/06. https://doi.org/10.1017/S1431927606066980
Wagner J, Schaffer M, Schmied M, Novak M. 3D Elemental Mapping using X-Ray Spectrometry in a Dual Beam-Focused Ion Beam. In Microscopy and Microanalysis. Vol. 12, Suppl. . 2006. p. 1242-1243. (Microscopy and microanalysis). https://doi.org/10.1017/S1431927606066980
Wagner, Julian ; Schaffer, Miroslava ; Schmied, Mario ; Novak, M. / 3D Elemental Mapping using X-Ray Spectrometry in a Dual Beam-Focused Ion Beam. Microscopy and Microanalysis. Vol. 12, Suppl. ., 2006. pp. 1242-1243 (Microscopy and microanalysis).
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