2D Maps for Visual Analysis and Retrieval in Large Multi-Feature 3D Model Databases

Benjamin Bustos, Daniel A. Keim, Christian Panse, Tobias Schreck

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationIEEE Visualization 2004
PublisherInstitute of Electrical and Electronics Engineers
Pages1-2
ISBN (Print)0-7803-8788-0
DOIs
Publication statusPublished - 2004
EventIEEE Visualization Conference - Austin, Tex., United States
Duration: 10 Oct 200415 Oct 2004

Conference

ConferenceIEEE Visualization Conference
CountryUnited States
CityAustin, Tex.
Period10/10/0415/10/04

Fields of Expertise

  • Sonstiges

Cite this

Bustos, B., Keim, D. A., Panse, C., & Schreck, T. (2004). 2D Maps for Visual Analysis and Retrieval in Large Multi-Feature 3D Model Databases. In IEEE Visualization 2004 (pp. 1-2). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/VISUAL.2004.2

2D Maps for Visual Analysis and Retrieval in Large Multi-Feature 3D Model Databases. / Bustos, Benjamin; Keim, Daniel A.; Panse, Christian; Schreck, Tobias.

IEEE Visualization 2004. Institute of Electrical and Electronics Engineers, 2004. p. 1-2.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Bustos, B, Keim, DA, Panse, C & Schreck, T 2004, 2D Maps for Visual Analysis and Retrieval in Large Multi-Feature 3D Model Databases. in IEEE Visualization 2004. Institute of Electrical and Electronics Engineers, pp. 1-2, IEEE Visualization Conference, Austin, Tex., United States, 10/10/04. https://doi.org/10.1109/VISUAL.2004.2
Bustos B, Keim DA, Panse C, Schreck T. 2D Maps for Visual Analysis and Retrieval in Large Multi-Feature 3D Model Databases. In IEEE Visualization 2004. Institute of Electrical and Electronics Engineers. 2004. p. 1-2 https://doi.org/10.1109/VISUAL.2004.2
Bustos, Benjamin ; Keim, Daniel A. ; Panse, Christian ; Schreck, Tobias. / 2D Maps for Visual Analysis and Retrieval in Large Multi-Feature 3D Model Databases. IEEE Visualization 2004. Institute of Electrical and Electronics Engineers, 2004. pp. 1-2
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