2D imaging system with optical tracking for EMI source localization

Hui He, Victor Khilkevich, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This research presents a 2D imaging system with optical tracking to localize radiating sources. Optical tracking system is used for localizing the position of the near field measurement probe. Emission source microscopy (ESM) algorithm derived from synthetic aperture radar (SAR) technique is used to localize radiating sources.

Original languageEnglish
Title of host publication2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, EMCSI 2015
PublisherInstitute of Electrical and Electronics Engineers
Pages107-110
Number of pages4
ISBN (Electronic)9781479919918
DOIs
Publication statusPublished - 13 May 2015
Externally publishedYes
Event2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, EMCSI 2015 - Santa Clara, United States
Duration: 15 Mar 201521 Mar 2015

Publication series

Name2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, EMCSI 2015

Conference

Conference2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, EMCSI 2015
CountryUnited States
CitySanta Clara
Period15/03/1521/03/15

Keywords

  • EMI
  • ESM
  • near-field scanning
  • optical tracking
  • SAR
  • source localization

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    He, H., Khilkevich, V., & Pommerenke, D. (2015). 2D imaging system with optical tracking for EMI source localization. In 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, EMCSI 2015 (pp. 107-110). [7107668] (2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, EMCSI 2015). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EMCSI.2015.7107668