@inproceedings{36f5e2404b82498cb0a0853f8237cf6a,
title = "2D imaging system with optical tracking for EMI source localization",
abstract = "This research presents a 2D imaging system with optical tracking to localize radiating sources. Optical tracking system is used for localizing the position of the near field measurement probe. Emission source microscopy (ESM) algorithm derived from synthetic aperture radar (SAR) technique is used to localize radiating sources.",
keywords = "EMI, ESM, near-field scanning, optical tracking, SAR, source localization",
author = "Hui He and Victor Khilkevich and David Pommerenke",
year = "2015",
month = may,
day = "13",
doi = "10.1109/EMCSI.2015.7107668",
language = "English",
series = "2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, EMCSI 2015",
publisher = "Institute of Electrical and Electronics Engineers",
pages = "107--110",
booktitle = "2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, EMCSI 2015",
address = "United States",
note = "2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity : EMCSI 2015 ; Conference date: 15-03-2015 Through 21-03-2015",
}