The SENTINEL project aims on the development of an entirely new class of high-resolution nano-probes for electric and thermal in-situ characterization in electron microscopes. The high resolution aspect is realized by functional tip modification via 3D nano-printing, while in-situ characterization becomes possible due to self-sensing cantilever platform for seamless integration into space restricted environments of electron microscopes. SENTINEL Nanoprobes™ open entirely new applications of correlated microscopy in materials research and nano-sciences (e.g. electrical and thermal characterization on the lower nano-scale) with yet unsurpassed capabilities.
|Effective start/end date||1/10/15 → 30/09/17|