Scanning Electron Microscopy , X-ray spectrometry and Electron Backscatter Diffraction

  • Schmied, Mario Michael, (Co-Investigator (CoI))
  • Zankel, Armin (Co-Investigator (CoI))
  • Wagner, Julian, (Co-Investigator (CoI))
  • Elis, Christof, (Co-Investigator (CoI))
  • Schröttner, Hartmuth (Co-Investigator (CoI))
  • Bahr, Peter, (Co-Investigator (CoI))
  • Reichmann, Angelika, (Co-Investigator (CoI))

Project: Research area

Description

Morphological investigations of organic and anorganic specimens by scanning- and field emission scanning electron microscopy (SEM FE-SEM and ESEM). Cryogenc investigations of radiation sensitive specimens and specimens liquid at room temperature. Electron microbeam analysis by energy- and wavelength dispersive X-ray spectrometry (EDXS and WDXS). Layer thickness measurement (in the submicrometer range) image processing, crystal orientation maps and phase analysis by EBSD; in situ experiments in the ESEM.
StatusFinished
Effective start/end date1/01/9531/01/03