Skip to main content
Press / Media
Multilayer capacitor ceramics: Segregation studies in grain boundaries and triple junctions.
(Principal Investigator (PI))
Institute of Electron Microscopy and Nanoanalysis (5190)
Grain boundary segregation and segregation into triple junctions influence the electronic behavior of multilayer capacitor ceramics significantly. AEM (EELS, EDX and EFTEM) is used to identify the segregants.
Effective start/end date
Analytical Electron Microscopy