Multilayer capacitor ceramics: Segregation studies in grain boundaries and triple junctions.

Brunegger, Albert (Co-Investigator (CoI))
Hofer, Ferdinand (Co-Investigator (CoI))
Kothleitner, Gerald (Co-Investigator (CoI))
Warbichler, Peter (Principal Investigator (PI))

Institute of Electron Microscopy and Nanoanalysis (5190)

Project: Research project

Description

Grain boundary segregation and segregation into triple junctions influence the electronic behavior of multilayer capacitor ceramics significantly. AEM (EELS, EDX and EFTEM) is used to identify the segregants.

Status	Finished
Effective start/end date	1/06/00 → 31/07/01

Multilayer capacitor ceramics: Segregation studies in grain boundaries and triple junctions.

Project Details

Description

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