High temperature attachment for 4-circle x-ray diffractometers

  • Eiper, Ernst, (Co-Investigator (CoI))
  • Sonderegger, Bernhard (Co-Investigator (CoI))
  • Resel, Roland (Co-Investigator (CoI))
  • Koini, Markus, (Co-Investigator (CoI))
  • Tamas, Eduard-Tiberiu, (Co-Investigator (CoI))

Project: Research area

Project Details

Description

In cooperation with the company Anton Paar GmbH, Graz new types of temperature attachments are developed. The attachments are suitable to any kind 4-circle diffractometer. The first attachment was commercially availabe in the year 2002, the second development was available from 2006.
StatusActive
Effective start/end date1/01/00 → …

Research Output

DHS1100: a new high-temperature attachment for materials science in the whole orientation space

Resel, R., 2007, In : Journal of applied crystallography. 40, 1, p. 202-202

Research output: Contribution to journalArticleResearchpeer-review

Evaluation of experimental stress-strain dependence in thermally cycled Al thin films on Si(100)

Keckes, J., Hafok, M., Eiper, E., Hofer, A., Resel, R. & Eisenmenger-Sittner, C., 2004, In : Powder diffraction. 19, 4, p. 367-371

Research output: Contribution to journalArticleResearchpeer-review

Thermally induced stresses in thin aluminium layers grown on silicon

Eiper, E., Resel, R., Eisenmenger-Sittner, C., Hafok, M. & Keckes, J., 2004, In : Powder diffraction. 19, 1, p. 74-76

Research output: Contribution to journalArticleResearchpeer-review