FWF - Robust IC - Studies of robustness of analog integrated circuits

Research output

Research output per year 2018 2018 2019 2019

• 1 Conference paper
• 1 Abstract
• 1 Poster
• 1 Lecture notes

Research output per year

Research output per year

Search results

• 2019

  Dose Rate Effects in MOS Transistors

  Bezhenova, V. & Michalowska-Forsyth, A. M., 9 Apr 2019, Radhard Symposium: Book of Abstracts. Seibersdorf Laboratories: Seibersdorf Laboratories Publisching, Austria, p. 23 1 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference paper

  • Bipolar 100%
  • Oxide 100%
  • Linear Circuit 33%
  • Reported Result 25%

• Radiation-hard voltage reference: from measurements-based VerilogA model of standard diodes and DTMOS to circuit realization

  Michalowska-Forsyth, A. M. & Bezhenova, V., 1 Apr 2019.

  Research output: Contribution to conference › Poster
• 2018

  Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing

  Bezhenova, V. & Michalowska-Forsyth, A. M., Apr 2018, p. 21. 1 p.

  Research output: Contribution to conference › Abstract

  Open Access

• Ionizing radiation and radiation hardness in analog integrated circuits - recent X-ray testing

  Bezhenova, V. & Michalowska-Forsyth, A. M., 25 Apr 2018

  Research output: Other contribution › Lecture notes