Electron-microscopical investigation of oxide layers on metals

  • Hofer, Ferdinand (Principal Investigator (PI))
  • Schmied, Mario Michael, (Co-Investigator (CoI))
  • Warbichler, Peter, (Co-Investigator (CoI))

Project: Research area


Thin oxide layers are prepared on the surface of nickel and titanium foils by using electrochemical methods. The layers are characterized by analytical electron microscopy of cross-sectioned samples which have been prepared by ion-milling. TEM-imaging, electron diffraction and EELS-spectrometry are used to measure thickness, crystallography and chemical composition of the oxide layers.
Effective start/end date1/01/9931/07/00