The structure and the interfaces of organic LED's consisting of several thin layers (aluminium, hexaphenyle und indium tin oxide) are characterized by means of analytical electron microscopy. Since these LED's contain both metals, oxides and polymers, TEM specimens are difficult to prepare. Consequently, we have to evaluate special techniques for the preparation of TEM cross-sections, such as cryo-ultratomy and ion-milling with Ar-ions. The morphology and chemistry of the interfaces between the layers will be analyzed with nanometer resolution in the STEM by means of EELS-line scans.
|Effective start/end date||1/01/99 → 31/10/00|