Characterization of Hard Metals and Hard-Metal Layers by Means of Quantitative Energy-Filtering TEM

Project: Research area

Description

The distribution of phases and of special doping elements in hard metals and ceramic layers on the surface of hard metal cutting tools are analyzed in the analytical electron microscope by means of energy-filtering TEM and EELS spectrometry. Spectra and elemental maps are quantified by using data redution methods which are under development at the FELMI. The results are compared with data obtained by means of the atom-probe field-ion microscope (APFIM).
StatusFinished
Effective start/end date1/10/9831/01/03